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Optical Sectioning Structured Illumination Microscope MS—OM/OS—SIM—001

MS-M/OS-SIM-001 adopts cutting-edge structured light illumination technology. A spatial light modulator is used to generate specific structured light, which is accurately projected onto the sample. Optical modulation is utilized to rapidly acquire section images. It breaks through the diffraction limit of traditional optical microscopes, enabling super-resolution imaging. Even sub-micrometer-level microstructures can be clearly revealed.

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    Specifications and Parameters

    Main Parameters

    Technical Indicators (Ordinary OS-SIM)

    Technical Indicators (Super-Resolution OS-SIM)

    Light Source

    LED light source (optional wavelengths: 365/470/555/630nm)

    Mode

    Widefield, OS-SIM, 3D tomography

    Horizontal Resolution

    ≤330nm (widefield), ≤260nm (OS-SIM)

    ≤120nm (OS-SIM)

    Vertical Resolution

    ≤600nm

    ≤300nm

    Imaging Speed

    30FPS

    Section Spacing

    Adjustable from 10nm-100μm

    Adjustable from 10nm- 100μm (user-selectable)

    Reconstruction Speed

    1 layer/s (2048 × 2048)

    1 layer/s (2048 × 2048); 20 layers/s (2048 × 2048) customizable

    Sample Thickness

    ≤200μm

    Field of View

    ≥130μm × 110μm (100X oil immersion objective)

    Camera

    4-megapixel (2048 × 2048), 95% quantum efficiency

    Performance Advantages

    ● Multi-wavelength Microscopy

    ● High-speed Imaging

    ● Ultra-high Resolution

    ● Real-time 3D Reconstruction

    ● Automated Control

    ● Advanced Illumination and Stable Imaging

    ● Compatibility and Low phototoxicity

    Application Fields

    Biomedicine，Materials Science，Cell Biology，Neuroscience，Drug R&D，Industrial Inspection 

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